
Increasing demands on the reliability of power electronics but at the same time growing reliability risks due to the high complexity of the devices make highly accurate lifetime models and improved reliability methods for the development of these power electronics components necessary. Dr. Alexander Otto from the Fraunhofer Institute for Electronic Nano Systems ENAS has successfully developed methods and models for these requirements and has now been awarded the Fraunhofer ENAS Research Award 2020 for his work.
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