Spectroscopic methods in the visible, near-infrared and infrared spectral range enable characterizing the transmission and reflection behavior of different gaseous, liquid and solid materials, e.g. semiconductors, optical filters or layers and layer stacks.   

Furthermore the available step-scan technique allows monitoring transients processes. Thus, for example, the measurement of gas-phase kinetics can be covered.


Vertex 70 (Bruker Optics GmbH)

  • wavelength range: 25000 – 370 cm-1
  • resolution: < 0.5 cm-1
  • wavelength resolution: < 0.01 cm-1 @ 2000 cm-1
  • photometric accuracy: < 0.1 % T  
  • Nitrogen flushing of the measurement chamber


We offer the following services:

  • Transmission-, reflection (specular: 5-80°, diffuse) and attenuated total reflection measurements
  • Determination of refractive index and layer thickness
  • Time-resolved FT-IR measurements
  • Application design