When the microwave interferes with the Wi-Fi reception: Researchers detect sources of electromagnetic interference

A phenomenon with which many people are familiar: Internet radio brings pop and rock classics directly into your kitchen via Wi-Fi, creating a good mood with lively rhythms. Cooking is much easier, and your favorite meal is on the table in no time. However, as soon as another kitchen aid joins the microwave, the lively musical enjoyment is dampened: Unpleasant static impairs the full, crystal-clear sound quality. Interference signals such as these are caused by electric, magnetic and electromagnetic fields and can bring even the most modern devices to their knees. Possible consequences are not only the failure of innovative technology but also dramatic safety risks – to business, science and society. Fraunhofer ENAS with its branch office at Paderborn University is dedicated to precisely this challenge: It detects electromagnetic sources of error and makes high-end technologies reliable and smart.

Discovered and proven by the physicists James Clerk Maxwell and Heinrich Hertz in the 19th century, electromagnetic fields (EMF) are physical force fields that result from an interaction of electric and magnetic fields

© Alex Tyson/Pexels/Canva
Occasionally not a good team: Electromagnetic fields from kitchen appliances such as microwaves can considerably affect the function of other household electronic devices, for example, internet radio reception via Wi-Fi on a smartphone or tablet.
© Andrea Piacquadio/Pexels/Canva
Always with us: Smartphones allow us to talk on the telephone, stream music or share photos with friends and family at any time. The use of smartphones and many other electric and electronic everyday helpers produces electromagnetic fields.
© Daniel Barbutti/Getty Images/Canva
Lightning fast: Electromagnetic fields of natural origin occur during storms, for example, when lightning illuminates the sky. They can considerably interfere with state-of-the-art electronics as a result of surge damage.

“A good example of these physical laws is the operation of a microwave. If the appliance is connected to a socket with mains voltage, an electric field is present. As soon as the microwave is switched on and current flows, in other words, electrically charged particles move through the current-carrying conductor, this movement produces a magnetic field. The interaction of these two fields results in an electromagnetic field that expands through space like a wave. This phenomenon is like when a stone falls into water. Electromagnetic fields behave in space like the waves that result on the surface of water from a stone. These fields also expand in a wave-like form and can, to stay with the example of a microwave, interfere with the Wi-Fi reception of a smartphone or tablet,” explains Dominik Schröder, research scientist and doctoral candidate in the “Smart Wireless Systems” department who works with electromagnetic fields at Fraunhofer ENAS in the Paderborn office.

 

Omnipresent: surrounded by electromagnetic fields

The appearance of electromagnetic fields is not limited to residential environments alone, however. We are surrounded by them every day and everywhere: “At the office, we naturally use Wi-Fi to search for information quickly in the internet or to communicate with colleagues via web conferences. When we are on the go, we can be reached by telephone at all times or listen to music via Bluetooth headphones thanks to our mobile companion, the smartphone. In the medical field, magnetic resonance imaging (MRI) is used to visualize internal structures of the human body and detect diseases. Electromagnetic fields also occur within our own four walls – regardless of whether we are doing laundry, listening to the radio or using the microwave,” says the scientist. 

Electromagnetic fields are not limited to anthropogenic sources, in other words, sources artificially created by people, though. These physical force fields also occur in nature. If an electric discharge happens during a storm, for example, the resulting lightning creates an electromagnetic pulse that spreads out in the form of a wave. The earth’s magnetic field is another typical example of such a naturally occurring field that protects from cosmic radiation from outer space.

“Electromagnetic fields not only occur in large dimensions but also on a very small scale. Several billion transistors are installed on a single semiconductor chip, for example. Our modern, technologized world would not be able to function without them. If their individual electromagnetic fields do not interact harmoniously but interfere with each other, it produces a dilemma,” explains the Fraunhofer researcher. 

 

Invisible but real: detecting interfering electronic fields with measurement technology

This is precisely one of the greatest challenges when using state-of-the-art technologies: When the expanding electromagnetic waves of a component meet the waves of other electric or electronic devices and thus further electromagnetic fields, superposition can cause an increased interference pulse. This interference pulse, which is also referred to as unwanted electromagnetic coupling or interference, makes itself known as static on the radio, on tablets or in headphones, for example.

It becomes dangerous when such interference sources limit the functioning of entire systems or cause them to fail completely. “In vehicles, for example, a multitude of components interact to ensure our safety and that of pedestrians via driver assistance systems. If a malfunction occurs due to unwanted electromagnetic interferences, the function of braking assistants could be affected, preventing a braking operation from being properly initiated – with fatal consequences for other road users. A similar phenomenon is also known from aviation: Mobile phones have to be turned off during starting and landing maneuvers in order to prevent unwanted interferences with the sensitive onboard electronics, such as navigation systems, and thus risks to passengers,” explains the researcher.

To prevent exactly that from happening, the scientists at Fraunhofer ENAS at the office in Paderborn are detecting such error sources that can lead to risky interference pulses. In doing so, they have an eye on interference factors between different electric and electronic objects as well as within a closed system. The reason for this is because the increasing miniaturization of systems means that more and more components are being arranged in smaller and smaller spaces. This growing density and complexity increase the susceptibility of the overall system to errors due to unfavorable interferences.

The detection work of the researchers is supported by the near-field scanner developed in Paderborn. It is able to detect above all strong, but also weak and inconspicuous interference fields, contactlessly, automatically and extremely precisely in the direct vicinity of the interference source, in the so-called near field, and to present them in a structured and clear manner.

In this way, the scientists overcome the barriers of existing investigation methods: “Established test methods and solutions for identifying interference sources frequently work according to the principle of trial and error and are very tedious, expensive and time-consuming. In the end, it remains unclear whether searching for causes using functional experiments leads to a meaningful result. A product has to be continually redesigned in the development and design phase of technologies in order to eliminate errors as the source of undesirable force fields. The resulting new geometries or arrangements of individual components in turn harbor the potential for new unintended errors – this unnecessarily costs time and poses a major obstacle when launching products on the market,” explains Dr. Christian Hedayat, head of the “Smart Wireless Systems” department at Fraunhofer ENAS.

This process is considerably accelerated by the near-field scanner technology of the Fraunhofer researchers: With the help of this technology, error sources can be precisely determined and exactly localized in a component. For this purpose, the researchers rely on the near-field scanner NFS3000 developed at the institute. This makes it possible to visualize electromagnetic fields in the range of 0 Hz to 90 GHz and thus low-frequency as well as high-frequency fields locally resolved from a few millimeters to centimeters above the test object. The positioning system of the NFS3000 with its spatial measuring range of 50 centimeters x 80 centimeters x 50 centimeters makes it possible to study measuring objects on the wafer level and component level as well as to measure complete electronic devices as well as antenna and radio technologies.

“For these measurements, we use specialized near-field probes. They are moved above the measuring object with a positioning accuracy of one micrometer and scan the component to be tested with high precision and in every spatial direction (x, y and z direction). If an even more specialized probe is required for the measuring object, a special application case or frequency range, we also develop this together with our customers,” explains Christian Hedayat.

© Fraunhofer ENAS
The near-field scanner of Fraunhofer ENAS makes things visible that are hidden to the naked eye: electromagnetic fields that are produced by components, for example, and can impair the functioning of entire systems. The figure shows an electromagnetic field simulation combined with near-field measuring data. The measured interference source is on the left side, an exemplary interference sink on the right side. Areas that can potentially cause increased EMC problems are shown in red.

A colored and spatially scanned field image of the measuring object is produced as the result of these measurements. This 2D or 3D representation of the component provides designers with concrete indications of strong electromagnetic fields with great interference potential that require an error correction in the design of the component. The targeted search for causes and immediate design adaptation make it possible to conserve valuable material resources and save time in the design and development process.

The field image thus reveals error and interference sources and thereby provides indications of the electromagnetic compatibility of the system, the so-called EMC. This describes the harmonious interaction of different electric and electronic systems and devices without undesirable electromagnetic disturbances.

“Manufacturers of electric or electronic solutions are legally required to ensure the EMC of their products before market entry. The observance of these obligatory EU directives is confirmed by the CE marking (Conformité Européenne or European Conformity), among other things. Thinking about EMC early on and excluding risky electromagnetic interferences from the very beginning is indispensable and can save unnecessary costs. This is precisely where we can support manufacturers as Fraunhofer ENAS and accompany them along the way to assessing CE conformity,” Christian Hedayat is convinced.

Electromagnetic field simulation: artificial modeling of force fields

In addition to the near-field measurement on physical parts, components and systems using the near-field scanner, the Paderborn researchers rely on electromagnetic field simulations. These digitally model electric and electronic objects and simulate their physical force fields using computers.

This modeling makes it possible to virtually test different geometries and design possibilities of the measuring object and to measure the effects of these parameter changes on the EMC. This helps development engineers to realize new products, according to Christian Hedayat. Revisions can directly flow into the design and development process – without requiring a physical prototype. This early detection of interference potentials makes it possible to enormously reduce the development costs of new technologies – by avoiding ever new prototype generations.

While their simulations in the near field artificially imitate the occurrence of electromagnetic fields near the measuring object, mathematical algorithms make it possible to predict the behavior of electromagnetic waves in space, in other words, in the far field. It is precisely this expansion of a wave that can cause interference potentials through superposition with the fields of other systems or devices.

“Our simulations allow us to predict the effect of the energy transported via the electromagnetic fields on the human body as well. After all, the manufacturers of technological solutions are legally obligated to observe permissible limits and thus exclude possible health risks from radiation exposure. The observance of these EU specifications is also confirmed by the CE marking and is an essential market access requirement for new products,” says Dominik Schröder.

The scientist is certain that in the future, clever AI algorithms could help to analyze measurement and simulation results even faster and automatically detect patterns for electromagnetic interferences in them. With the support of AI, the development of highly complex electronic high-tech systems could be considerably accelerated even more.

 

A compact offer: research and development services in the area of electromagnetic detection

Fraunhofer ENAS is your competent and trustworthy partner for research, development and measurement services in the area of electromagnetic fields.

As part of its European Test and Reliability Center (ETRC), Europe’s newest cutting-edge center for tests and reliability assessments, the institute offers its customers the following services:

  • Measurement and test services:
    • Near-field measurements of electromagnetic fields up to 90 GHz for applications in the chip industry, communication and entertainment electronics, radio technology, medical engineering, aerospace, radar technology or in the area of Internet of Things (IoT) for
      • EMC characterization and troubleshooting
      • Far-field assessment from near-field measurements
      • Generation of near-field sources
      • Contactless quality and functional analysis
    • (Micro-)magnet measurements
  • Research and development services:
    • Electromagnetic simulations with and without the use of near-field scanning results
    • Near-field- and simulation-based EMC debugging
    • Development of probes for specific applications
    • Development of customized measuring tools
    • Accompanying measurements of product development

If you are also interested in collaborating with us and would like to know more about our research and development work, please contact our experts today.

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