Design, Simulation and Modeling

We offer application-oriented design starting from the concept via component to device and system, while taking design for reliability into account.

 

MEMS/NEMS

• Inertial sensors
• RF MEMS
• MOEMS

 

Materials, processes and equipment for micro and nanoelectronics

• Multi-scale simulation of thin film deposition (PVD, CVD, ALD, ECD) for process and reactor optimization
• Simulation of surface chemistry and film growth
• Structural, thermal, mechanical and electronical properties of thin films and nano materials

 

Electronics and communication

• Analog and digital circuits and mixed signal
• PCB layout
• Basic software programming
• RF circuit design
• Antenna design for data and energy transmission

 

Electrical and multi-physical systems

• Electro-mechanical coupling
• Modeling, simulation and measurement of parasitic electromagnetic effects
• Structural analyses
• Thermo-mechanical induced packaging stress
• Chip, packages, modules, PCB

 

Micro and nano devices and systems

• Thermal and electrical simulation of ULSI interconnect systems
• TCAD simulation of strained ULSI transistors
• Multi-scale modeling of CNT FETs
• Ab initio simulation of electron transport in nanostructures
• Modeling of sensors based on nanomaterials
• Mask design, layout, technology support
• Electromagnetic simulations of antennas and systems
• Methodologies for multi-scale modeling of NEMS
• Electromagnetic simulations of RF MEMS components

 

Fluidic systems

• Liquid-based microfluidic systems
• Gas-based microfluidic actuators

 

Reliability

• Analysis, assessment and prediction of reliability
  • Mechanical and thermoelectromechanical
  • Crack and fracture modeling
  • Multi-field effects
  • Validation via coupling of simulation and experiments
• Fracture and damage mechanics (mm ... sub-nm)
  • Cohesive zone modeling (CZM)
  • Extended FEM (X-FEM)
• Life-time prognosis
• Virtual prototyping, robustness analysis and optimization
• Electromagnetic reliability analysis
• Near field localization of hot spots
• Near field/far field transformation