Advanced System Engineering

Services and Measurement Techniques#

The department Advanced System Engineering provides customer-specific developments for industry and research institutes. All presented areas of research are available for services. In the following a short survey of special services and used measurement techniques is listed.

We offer the following services:

  • Research and design of customer-specific electronic modules
  • Model-based development methodologies for heterogeneous systems
  • Development and optimization of RF antenna structures and circuits (RFID, WLAN and others) based on simulation and measurement methods
  • Development of wired and wireless sensor systems
  • EMC and EMR analysis, characterization and modeling of micro and nano electronic circuits and of parasitic electromagnetic effects
  • Signal integrity analyses

 

Equipment:

  • 3D near-field scanner for DUT sizes up to 50 x 80 x 50 cm;  frequency range: DC – 6 GHz, optical contour determination of DUT surface
  • 4-port network analyzer (Agilent N5230A):
    frequency range: 30 kHz – 20 GHz; application: vectorial characterization of 4-port networks
  • Impedance analyzer (Agilent 4294A): frequency range: 40 Hz – 110 MHz; application: characterization of lumped complex components, single port networks in low frequency domain
  • Spectrum analyzer (HP 8563 E): frequency range: 9 kHz – 26 GHz; application: scalar frequency domain measurements, e.g. analysis of radiated spectrum of DUT
  • Communication Signal Analyzer (Tektronix CSA 803): application: Time Domain Reflectometry characterization of transmission paths (20 GHz bandwidth), localization of impedance mismatches in transmission lines (e.g. cables) with ~ 5 mm resolution, high-speed sampling oscilloscope (up to 50 GHz)
  • FCC TEM Crawford Cell (FCC-TEM-JM1):
    frequency range: DC – 1200 MHz; application: immission and emission analysis for small objects such as ICs, modules, etc.
  • Waferprober Cascade Summit 9000:
    application: direct RF-conform probe testing of wafers or micro systems; probes can be placed with micrometer precision
  • 4-channel oszilloscope (LeCroy waveRunner 640Zi):
    band width: 4 GHz, 40 GS/s; application: characterization of high-frequency time domain signals, analysis of single events in long-time intervals by software controlled event triggers, synchronous analysis of analog (4 channel) and digital (18 channel) signals.

 

Simulation Environment:

  • CST STUDIO SUITE: Complete technology for 3D EM simulation; application: analysis of electromagnetic, electrostatic, magnetostatic and thermal behavior of 3D structures, combination of 3D simulation and circuit simulation results
  • ANSYS Multiphysics application: 3D simulation of electromagnetic, mechanical and thermal effects