Chemnitz Seminar Test and Reliability

Event details

Costs

free of charge

Location

Technology Campus Chemnitz

Date

September 02, 2026 - September 03, 2026

Language

English

Tabbed contents

Agenda

Wednesday \| September 2, 2026 \| 1.00 – 10.00 pm Location: research center MAIN, Chemnitz University of Technology (Rosenbergstrasse 6, 09126 Chemnitz)
1.00 – 1.15 pm	Welcome Prof. Dr. Harald Kuhn, Fraunhofer ENAS and Prof. Dr. Bernhard Wunderle, Chemnitz University of Technology
1.15 – 2.00 pm	Welcome Adresses Prof. Dr. Thomas von Unwerth, Vice President for Transfer and Academic Qualification of Chemnitz University of Technology Robert Denk, Head of Department Universities, Saxon State Ministry of Science, Culture and Tourism Mayor Sven Schulze, City of Chemnitz Prof. Dr. Oliver Schmidt, Director of Research Center MAIN Prof. Dr. Harald Kuhn, Fraunhofer ENAS Prof. Dr. Bernhard Wunderle, Chemnitz University of Technology
2.00 – 2.15 pm	Opening of CRYME – Cryo-Lab for Materials and Electronics Packaging Chemnitz
2.15 – 3.00 pm	Coffee break
Scientific Session
3.00 – 3.30 pm	Multi-scale thermo-mechanical characterisation for quantum- & cryo-packaging Prof. Dr. Bernhard Wunderle, Chemnitz University of Technology, Professorship Materials and Reliability of Microsystems
3.30 – 3.50 pm	Technology Modules for Quantum Technology Systems Dr. Danny Reuter, Chemnitz University of Technology, Center for Micro and Nanotechnologies ZfM
3.50 – 4.10 pm	Integration and Cryogenic Testing of Single-Photon Avalanche Diodes (SPADs) for Ion Trap Quantum Computing Dr. Lukas Uhlig, Fraunhofer ENAS
4.10 – 4.30 pm	Advancing Reliability Characterization into the Cryogenic Domaine. Dr. Remi Pantou, Fraunhofer ENAS
4.30 – 5.00 pm	Coffee break
Industrial Session
5.00 – 5.30 pm	The road to utility-scale ion trap QPUs: An industrial perspective Matthias Dietl, Infineon Technologies Austria
5.30 – 6.00 pm	From Idea to Metrics: Systematic Testing for Quantum Computers at eleQtron André Nauen, EleQtron GmbH
6.00 – 6.35 pm	Enabling Raman at Low Temperature – cryoRAMAN: A system approach to reliable low-temperature Raman Dr. Thomas Olschewski, Oxford Instruments \| WITec GmbH und Dr. Tobias Scharff, attocube systems GmbH
6.35 – 6.45 pm	Conclusion Day 1
6.45 – 10.00 pm	Get together / Networking and CRYME lab tours
Thursday \| September 3, 2026 \| 9.00 am – 3.30 pm Location: Fraunhofer ENAS (Technologie-Campus 3, 09126 Chemnitz)
9.00 – 9.10 am	Welcome on day 2: Characterization, Test and Reliability – CTR Prof. Dr. Daniel Kriesten, Fraunhofer ENAS
Session: Silicon Saxony –Working Group “Test, Analysis & Reliability”
9.10 – 9.35 am	Introduction to Silicon Saxony and the Working Group "Test, Analysis & Reliability" Dr. Martina Vogel, Silicon Saxony
9.35 – 10.00 am	Beyond Ice and Fire – From Electrical Test to Multi-Physics Test: When Semiconductor Test Goes Beyond Electrical & Thermal Control Marcus Verhoeven, aSpect Systems GmbH
10.00 – 10.25 am	Driving Innovation in Semiconductor Test: Trends, Challenges, and ATE-Evolution Matthias Werner, Advantest Corporation
10.25 – 11.00 am	Coffee break
Session: Advanced CTR
11.00 – 11.25 am	Strategic Unique Selling Propositions of FMD/APECS through CTR Johannes Rittner, Research Fab Microelectronics Germany FMD
11.25 – 11.50 am	EDC Semiconductor Test, Analyse- und SCM Services Markus Gaitzsch, EDC Electronic Design Chemnitz GmbH
11.50 am – 12.15 pm	The ETRC at Fraunhofer ENAS: Labs and Tools Prof. Dr. Daniel Kriesten, Fraunhofer ENAS
12.15 – 1.15 pm	Lunch break
Session: CTR on Another Level
1.15 – 1.40 pm	Challenges in high-power semiconductor testing Konrad Domes, SAXOGY POWER ELECTRONICS GmbH
1.40 – 2.05 pm	Highly Parallel Electronic Parameter Testing Method Efx Dr. Ulrich Pohl, ATEip GmbH
2.05 – 2.30 pm	Thoughts about “Next Level of Quality” in Integrated Circuits Ralf Arnold, Fraunhofer ENAS
2.30 – 2.40 pm	Conclusion Prof. Dr. Daniel Kriesten, Fraunhofer ENAS
2.45 – 3.30 pm	Individual lab tours